A silicon test specimen made of single crystal silicon of overall dimensions 5 x 5mm and is 0.5mm thick.
Certified Planotec silicon test specimen on 15mm Hitachi stub
This test specimen is made of single crystal silicon of overall dimensions 5 x 5mm and is 0.5mm thick. It is marked with clearly visible squares of periodicity 10µm. The dividing lines are about 1.9µm in width and are formed by electron beam lithography. A broader marking line is written every 500µm, which is a very useful additional feature for light microscopy. This is an excellent specimen for comparing magnification and assessing any distortion in the image field. It is particularly useful in the context of automated counting systems to check for distortions. Where critical measurements must be made, the sample can be mounted directly onto the calibration specimen so that an internal calibration is obtained on the micrograph. A certificate of calibration can be supplied for the silicon test specimen if required. The silicon specimen can be supplied on any stub. Please enquire.