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Selvyt® lint-free cloth is free of static, and is useful for general purpose cleaning of metal surfaces. -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm, pin diameter 3.2mm, Brass, Pack of 10 -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm, pin diameter 3.2mm, Copper, Pack of 10 -
SEM Specimen Stubs for most SEM instruments. 12.5mm dia, pin length 8mm, pin diameter 3.2mm. -
12.5mm aluminium pin stub with a slot and two grub screws, allowing specimens to be clamped for examination. (ea) -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20 deg chamfer. Aluminium. Pack of 100. -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45 deg chamfer. Aluminium. Pack of 10. -
SEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm. Pack of 100. -
SEM Specimen Stubs for most SEM instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium, Pack of 100 -
SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium. Pack of 50. -
SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium ,Pack of 50. -
SEM Specimen Stubs for JEOL instruments. 25mm dia, pin length 10mm, cylinder stubs. Aluminium. Pack of 50. -
SEM Specimen Stubs for JEOL instruments. 50mm dia, pin length 5mm. Aluminium. Pack of 50.
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45 deg chamfer. Aluminium. Pack of 10. -
SEM Specimen Stubs for JEOL instruments. 25mm dia, pin length 5mm, cylinder stubs. Aluminium, Pack of 50 -
SEMClip 18mm Pin Mount 1 Clip
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