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Standard stubs are manufactured from an aluminium alloy which contains approximately 5% copper. For analytical applications, these stubs are made from an alloy with lower levels of impurities. -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm, pin diameter 3.2mm, Brass, Pack of 10 -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm, pin diameter 3.2mm, Copper, Pack of 10 -
SEM Specimen Stubs for most SEM instruments. 12.5mm dia, pin length 8mm, pin diameter 3.2mm. -
12.5mm aluminium pin stub with a slot and two grub screws, allowing specimens to be clamped for examination. (ea) -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20 deg chamfer. Aluminium. Pack of 100. -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45 deg chamfer. Aluminium. Pack of 10. -
SEM Specimen Stubs for most SEM instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium, Pack of 100 -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45 deg chamfer. Aluminium. Pack of 10. -
SEMClip 18mm Pin Mount 1 Clip -
Semclip 25mm Pin Mount 1 Clip -
Semclip 25mm Pin Mount 2 Clips -
Semclip 25mm Pin Mount 3 Clips
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