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A silicon test specimen made of single crystal silicon of overall dimensions 5 x 5mm and is 0.5mm thick. -
Dumont MOUNT TWEEZERS STYLE 2E1/2, Polished Dumoxel, Antimagnetic -
Dumont MOUNT TWEEZERS STYLE 2E1/4, Polished Dumoxel, Antimagnetic
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Dumont MOUNT TWEEZERS STYLE 2E1/8, Polished Dumoxel, Antimagnetic -
Standard stubs are manufactured from an aluminium alloy which contains approximately 5% copper. For analytical applications, these stubs are made from an alloy with lower levels of impurities. -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm, pin diameter 3.2mm, Brass, Pack of 10 -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm, pin diameter 3.2mm, Copper, Pack of 10 -
SEM Specimen Stubs for most SEM instruments. 12.5mm dia, pin length 8mm, pin diameter 3.2mm. -
12.5mm aluminium pin stub with a slot and two grub screws, allowing specimens to be clamped for examination. (ea) -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20 deg chamfer. Aluminium. Pack of 100. -
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45 deg chamfer. Aluminium. Pack of 10. -
SEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm. Pack of 100. -
SEM Specimen Stubs for most SEM instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium, Pack of 100 -
SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium. Pack of 50. -
SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium ,Pack of 50. -
SEM Specimen Stubs for JEOL instruments. 25mm dia, pin length 10mm, cylinder stubs. Aluminium. Pack of 50.
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