-
Nickel, Slot 2x0.5mm, Ultra-thin 3-4nm, 50/box -
Nickel, Slot 2x1mm, Extra-thick 20-30nm, 50/box
-
Nickel, Slot 2x1mm, Standard coating 5-6nm, 25/box
-
Nickel, Slot 2x1mm, Standard coating 5-6nm, 50/box
-
Nickel, Slot 2x1mm, Thick 10nm, 50/box
-
Nickel, Slot 2x1mm, Ultra-thin 3-4nm, 50/box
-
Standard, Carbon, Adhesive Tabs, 12mm dia 100/pk. -
Standard, Carbon, Adhesive Tabs, 25mm dia 50/pk.
-
Standard, Carbon, Adhesive Tabs, 6mm dia 100/pk.
-
Cartridge Filaments for Hitachi (Box of 10) -
Negatively stained catalase crystals show lattice plane spacings of approximately 8.75nm and 6.85nm very clearly (using TEM and STEM). (Figures determined by Wrigley. J. Ultrastructure Res. 24, 454. 1968). They are valuable for high magnification calibration. -
CD Calibration Specimen 0.5-10um GPTB Certified -
CD Calibration Specimen 0.5-10um Non Certified
-
Critical dimension (CD) calibration test specimens - 500-200-100 nm structure -
CD Calibration Specimen 500-200-100nm with GPTB Cert.
-
A silicon test specimen made of single crystal silicon of overall dimensions 5 x 5mm and is 0.5mm thick.
Contact us +61 (8) 8250 3687|emgrid@emgrid.com.au
